Latest Development - Tomo-Analytic
Combined 3-D X-Ray microtomograph and |
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Computer-aided tomography (µCAT) systems are configured to take many views of the object in order to build a 3-D model of its internal structure. 2-D slices through this volume can be viewed as images, or the 3-D volume may be rendered, sliced, and measured directly. For the NDT inspection of miniaturised samples the microtomography analysis is guaranteed for feature recognition down to a few tens of microns. 3-D tomographic reconstructions are obtained by a proprietary highly optimized computer code based on a modified Feldkamp algorithm. The microbeam fluorescence (µXRF) component is a configurable film thickness and composition measuring tool. It includes mechanical or optical X-ray beam collimation options, Amptek PIN diode X-ray detector and analysis software, motorized micrometric x-y-z stage for accurate sample positioning. A visual image of the sample is synchronized with the µXRF scanning in order to pinpoint measurement location, as well as for historical documentation. |
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![]() The XRF analysis with Fundamental Parameters converts elemental peak intensities to elemental concentrations and/or film thicknesses. |
Application area of the product X-ray-tomography as an NDT tool can provide information on: The (µXRF) system provides high resolution composition mapping and accurate thickness measurements of multilayer samples. The main area of application are microelectronics, oil industry (sulphur content) , geology. |