research
 
NDT inspection of W coating uniformity

 

                 
Log(Ind-dark)-Log(Id-Dark) – where
Dark is the image obtained without
X-rays (detector intrinsic background)

Plot obtained after averaging three region of interest for the three thicknesses. The absolute errors in thickness are about 3%!
X-ray micro-radiography inspection of CFC/Cu brazed sample
X-ray micro-radiography along the 19 mm side of the package. One can see the interface between CFC and Cu plate. Its structure suggests that “gains/droplets” of metallic Cu penetrate into CFC substrate in a “finger-like” patern. Also one can see the density variations within CFC layer.

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