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Items |
Main
specifications for current X-ray microtomography configuration |
Main
specifications to be reached at the end of the project for X-ray
nanotomography |
X-ray source |
Max. high
voltage: 160 kVp
Max power: 20 W
Feature recognition: ~ 5 µm |
Maximum high
voltage: 160 kVp
Maximum power: 15 W
Feature recognition: ~ 300 nm |
Detector
elements |
768 x 576 image
intensifier (XII)
1248 x 1248 a-Si flat panel |
Same + 2048 x
2048 camera, 25 µm/pixel |
Digital Output |
10 bits XII, 12
bits a-Si |
Same + 16 bits
XII |
Effective Area
of Detector |
169x169 mm2
XII, 120x120 mm2 a-Si |
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Micrometric
manipulator |
X stage |
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Z stage |
θ stage |
Sample fine
adjustment |
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|
travel 500mm,
loading cap. 30kg |
|
travel 300mm,
loading capacity 6kg |
accuracy
0.03°, loading cap. 20kg |
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travel 800mm, loading capacity 30kg |
travel 1200mm, loading capacity 50kg |
travel 300mm, loading capacity 6kg |
accuracy 0.02°, loading capacity 30kg |
accuracy 10µm, repeatability 5µm, |
loading capacity 2kg |
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Magnification
Factor |
< 1000 |
< 2000 |
Spatial
Resolution |
aprox. 10µm |
≥500 nm |
Scanning Time |
< 15min.
(720 angles) |
< 15min.
(720 angles) |
3D
Reconstruction Time |
< 2min.
(256x256, 256 lines)
< 20min. (1024x1024, 512 lines) |
< 30min.
(2048x2048, 1024lines) |
Scaning Method |
Cone beam CT
Full scan (360deg.) |
Cone beam CT
Short Scan (180deg.+1/2 fan angle)
Oblique View Cone Beam |
Main
characteristics of the electron tomography
that will be developed in this project |
Microscope |
TEM Jeol 200CX |
Detector |
CCD camera 2048x2048 pixels |
Goniometer range |
±60°, 120 projection angles |
Magnification factor |
104-105 |
Spatial resolution |
aprox. 10-20 nm |
Reconstruction methods |
FBP, Maximum Entropy, ART |
3D reconstruction time |
< 30min. (volume 512x512x512
voxels) |
Stage 1 - 2006: Sub-micron imaging of advanced materials
Stage 2 - 2007: |
Complex
numerical modelling (physics, mechanics, imaging), scanning configuration
and tomographic reconstruction configuration calibration. Realization of
tomographic subsystems.
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Stage 4 - Sept 2008: |
Laboratory setup for submicronic digital radiography.
Fabrication of TEM tomograph subsystems. |
Stage 4 - Sept 2008: Nano/micro electron and X-ray tomography - experimental validation.
Final report (English) 
Publications:
Journals:
- I. Tiseanu, T. Craciunescu, T. Petrisor, A. della Corte. 3D X-ray micro-tomography for modeling of NB3SN multifilamentary superconducting wires. Fusion Engineering and Design, 82, p. 1447–1453, 2007
- T. Kai, N. Okada, M. Baba, T. Takahashi, M. Misawa, I. Tiseanu, N. Ichikawa, Structure of effective catalyst layers around bubbles in a fluidized catalyst bed, Chemical Engineering Journal 130(2007)119-124.
- Augieri, G. Celentano, L. Ciontea, V. Galluzzi, U. Gambardella, J. Halbritter, T. Petrisor, A. Rufoloni, A. Vannozzi, Angular properties of pure and Ca-substituted YBa2Cu3O7-δ Superconducting thin films grown on SrTiO3 and CeO2 buffered Al2O3 substrates, Physica C: Superconductivity and its Applications Volume 460-462 II, Issue SPEC. ISS., 1 September 2007, Pages 829-830
- N. Pompeo, E. Silva, R. Marcon, V. Galluzzi, G. Celentano, A. Augieri, T. Petrisor, Microwave properties of YBa2Cu3O7-δ films with BaZrO3 nanoinclusions, Physica C: Superconductivity and its Applications, Volume 460-462 I, Issue SPEC. ISS., 1 September 2007, Pages 412-413
- Vannozzi, A. Augieri, G. Celentano, L. Ciontea, F. Fabbri, V. Galluzzi, U. Gambardella, A. Mancini, T. Petrisor, A. Rufoloni, Cube textured substrates for YBCO coated conductors: Influence of initial grain size and strain conditions during tape rolling, IEEE Transactions on Applied Superconductivity, 17-2(2007) 3436-3439
- V. Galluzzi, A. Augieri, L. Ciontea, G. Celentano, F. Fabbri, U. Gambardella, A. Mancini, T. Petrisor, N. Pompeo, A. Rufoloni, E. Silva, A. Vannozzi, YBa2Cu3O7-δ films with BaZrO3 inclusions for strong-pinning in superconducting films on single crystal substrate, IEEE Transactions on Applied Superconductivity 17-2(2007)3628-3631.
- G. Augieri, G. Celentano, U. Gambardella, J. Halbritter, T. Petrisor, Analysis of angular dependence of pinning mechanisms on Ca-substituted YBa2Cu3O7-δ epitaxial thin films, Superconductor Science and Technology 20-4(2007) 381-385
- I. Tiseanu, T. Craciunescu, G. V. Aldica, M. Iovea. X-ray micro-tomography as a tool for quantitative characterization of advanced materials manufacturing processes. Advanced Materials Research, 47-50, pp. 698-701, 2008.
- Gh. V. Aldica, P. Nita, I. Tiseanu, T. Craciunescu, P. Badica. High density MgB2 superconductor: structure and SEM investigations. Journal of Optoelectronics and Advanced Materials, 4, pp. 929 - 932, 2008.
- A. Barau, V. Budarin, A. Caragheorgheopol, R. Luque, D.J. Macquarrie, A. Prelle, V. S. Teodorescu, M. Zaharescu, A Simple and Efficient Route to Active and Dispersed Silica Supported Palladium Nanoparticles, Catalysis Letters, 2008, 124:204–214, DOI 10.1007/s10562-008-9465-x
- I. Tiseanu, T. Craciunescu, Assessment of the Aplicability of X-Ray Tomography for Irradiated Samples, in curs de publicare in Fusion Engineering and Design
- P. Badica, G. Aldica, T. Craciunescu, I. Tiseanu, Y. Ma, K. Togano, Microstructure of MgB2 samples observed through X-ray Microtomography, in curs de publicare in Superconducting Science and Technology
Conferences:
- I. Tiseanu, T. Craciunescu, T. Petrisor, A. della Corte. 3D X-ray micro-tomography for modeling of NB3SN multifilamentary superconducting wires. 24th Symposium on Fusion Technology, 11-15 Sept. 2006, Varsovia, Polonia
- Gh.V. Aldica, P. Nita, I. Tiseanu, T. Craciunescu, P. Badica, High Density MgB2 Superconductor: Structure and Morphology through Microtomography and SEM Investigations, 5th International Conference, “New Research Trends In Material Science”, ARM-5, Sibiu, Romania, 5 – 7September, 2007
- I. Tiseanu, T. Craciunescu, X-ray Microtomography Experience at National Institute for Laser, Plasma and Radiation Physics, Bucharest, Romania, Prezenata la Fachtagung Prozessnahe Röntgenanalytik Berlin, Germany, 15-16 November 2007
- M. Simon, I. Tiseanu, C. Sauerwein, S.-M. Yoo, I.-S. Cho, Development of multi sensor and multi source computed tomography Systems, DIR 2007 - International Symposium on Digital industrial Radiology and Computed Tomography, June 25-27, 2007, Lyon, France
- M. Simon, I. Tiseanu, C. Sauerwein: Characterization of Automotive Parts by a Novel Multi-Scan Tomography System, 4th International Conference Emerging Technologies in Non-Destructive Testing, April 2-4, 2007, Stuttgart, Germany.
- L. Ciontea, G. Celentano, A. Augieri, T. Ristoiu , R. Suciu, M. S. Gabor, A. Rufoloni, A Vannozzi, V Galluzzi, T Petrisor, Chemically Processed BaZrO3 Nanopowders as Artificial Pinning Centres, 8th European Conference on Applied Superconductivity, EUCAS’07 Bruxelles 16-20 September 2007.
- L. Ciontea, A. Angrisani, G. Celentano, T. Petrisor jr., A. Rufoloni, A. Vannozzi, A. Augieri, V. Galuzzi, A. Mancini, T. Petrisor, Metal Propionate Synthesis of Epitaxial YBa2Cu3O7-x Films, Prezentata la 8th European Conference on Applied Superconductivity, EUCAS’07 Bruxelles 16-20 September 2007
- Gh.V. Aldica, P. Nita, I. Tiseanu, T. Craciunescu, P. Badica, X-ray micro-tomography as a tool for quantitative characterization of advanced materials manufacturing processes, "International Conference on Multi-functional Materials and Structures” 28-31July 2008, Hong Kong SAR, China
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- I. Tiseanu, T. Craciunescu, P. Badica, G.V. Aldica, M. Rindfleisch, Characterization of Superconducting Wires by Cone-Beam Micro-Tomography, acceptata pentru prezentare la IEEE 2008Workshop on X-Ray Micro Imaging of Materials, Devices, and Organisms, 22-24 October 2008 Dresden, Germany
- M. Iovea, O.Duliu, G.Mateiasi, M. Neagu, M. Mangu, I. Tiseanu, T. Craciunescu, Preliminary experiments for X-Ray dual-energy Micro-Tomography quantitative analysis.
- Badica, G. Aldica, T. Craciunescu, I. Tiseanu, Y. Ma, K. Togano, Microstructure of MgB2 samples observed through X-ray Microtomography, acceptata pentru prezentare la IEEE 2008 Workshop on X-Ray Micro Imaging of Materials, Devices, and Organisms, 22-24 October 2008 Dresden, Germany
- M. Iovea, G.Mateiasi, M. Neagu, M. Mangu, O. Duliu, I. Tiseanu, T. Craciunescu, Materials microanalysis technique by dual-energy X-ray Tomography and Radioscopy, NDT 2008 15-18 September, Shrigley Hall Hotel, Nr Macclesfield, Cheshire, UK
- I. Tiseanu, T. Craciunescu, Assessment of the Aplicability of X-Ray Tomography for Irradiated Samples, 24th Symposium on Fusion Technology, 15-19 Sept. 2008, Rostock, Germany.
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